This device is not recommended for new designs. For new designs, please use: SiT1602, SiT8008, or SiT8009. This device will continue to be available in production volumes. Download datasheet.

"Specs" "Value"
Oscillator Type XO-SE
Frequency 1 to 200 MHz
Frequency Stability (ppm) ±10, ±15, ±20, ±25, ±50, ±100
Output Type LVCMOS
Operating Temperature Range (°C) 0 to +70, -20 to +70, -40 to +85
Voltage Supply (V) 1,8, 2.5, 2.8, 3.3
Package Type (mm²) 2.5x2.0, 3.2x2.5, 5.0x3.2, 7.0x5.0
Recommendations Not recommended for new designs
Replacement Part SiT1602, SiT8008, SiT8009

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Electronics Industry Citizen Coalition Template Other Quality Documents
Manufacturing Notes for SiTime Products Other Quality Documents
SiTime Conflict Minerals Policy Other Quality Documents
SiTime Environmental Policy Other Quality Documents
SiTime Warranty on Date Code Other Quality Documents
SiTime Oscillator Reliability Report (0.18 micron CMOS process products) Reliability Reports
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
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4L/6L-QFN Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
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Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
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Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SC-AN10007 时钟抖动定义与测量方法 Application Notes
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Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Misc. Resources
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
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AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
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AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
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