1 to 340 MHz, Ultra-Low Jitter, ±20 to ±50 ppm, I2C Programmable Oscillator

The Endura™ SiT3541 is an ultra-low jitter, user-programmable oscillator, engineered to deliver high reliability in aerospace and defense applications. This device utilizes SiTime's unique DualMEMS™ temperature sensing and TurboCompensation™ technology to deliver exceptional dynamic performance in harsh environments, making it:

  • Resistant to airflow and thermal shock
  • Resistant to mechanical shock and vibration
  • Robust against power supply noise

The device supports two in-system programming options:
   1) Any-frequency mode to reprogram the clock output to any frequency between 1 MHz to 340 MHz
   2) Digitally controlled oscillator (DCO) mode to steer or pull the clock up to ±3200 ppm

Endura SiT3541 conforms to MIL-PRF-55310 and MIL-STD-83 specifications.

View related products: 340 to 725 MHz

I2C/SPI programmable oscillators in small 5.0 x 3.2 mm packages
Oscillator Type I2C/SPI ISP XO-DE
Frequency 1 to 340 MHz
Frequency Stability (ppm) ±20, ±25, ±50
Phase Jitter (rms) ≤ 0.23 ps
Output Type LVPECL, LVDS, HCSL
Operating Temperature Range (°C) -40 to +85
Pull Range (ppm) ±25, ±50, ±80, ±100, ±125, ±150, ±200, ±400, ±600, ±800, ±1200, ±1600, ±3200
Voltage Supply (V) 2.5 to 3.3
Package Type (mm²) 5.0 x 3.2 10-pin
Features Ultra-low acceleration sensitivity, MIL-STD-55310, MIL-PRF-883, In-System Programmable via I2C/SPI
Availability Production

In-system programmable from 1 MHz and 340 MHz via I2C/SPI

Digital frequency pulling (DCO) via I2C/SPI

  • Output frequency pulling with perfect pull linearity

  • 13 programmable pull range options to ±3200 ppm

  • Frequency pull resolution as low as 5 ppt (0.005 ppb)

Low acceleration sensitivity

  • As low as 0.1 ppb/g

Integrated LDO for on-chip power supply noise filtering

  • 0.05 ps/mV power supply noise rejection (PSNR)

  • Reduces BOM by eliminating a LDO

Programmable LVPECL, LVDS, or HCSL output

  • Programmable LVPECL, LVDS swing

  • LVDS common mode voltage control

  • Optimizes signal integrity

Superior reliability

  • 1 billion hours MTBF

  • Lifetime Warranty: Reduces repair costs and field failures due to clock components

  • Land mobile radio
  • Field communications
  • Avionics
  • Engine management/control
  • Satellite base station
  • All ruggedized applications
  • Command & control
  • UAV communications
  • Vehicle comms/telemetry
  • Flight computer platform
  • Satcom
  • GNSS/navigation

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Resource Name Type
AN10006 Best Design and Layout Practices Application Notes
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
AN10028 Probing Oscillator Output Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
AN10050 I2C/SPI Programmable Oscillators Application Notes
AN10029 Output Terminations for Differential Oscillators Application Notes
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
MEMS Timing for High Reliability Applications Product Briefs
QFN 5032 10-Pins 3D Step Models
SiT3541 Datasheet Datasheets
Timing Solutions for Aerospace & Defense Brochures/Fliers
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
Building Robust Aerospace and Defense Products with Ruggedized Endura MEMS Oscillators White Papers
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
SiTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes