1 to 110 MHz, SOT23 Oscillator

The SiT2001B is a SOT23 oscillator that offers the best board-level solder-joint reliability and enables low-cost, optical-ONLY board-level inspection. This device features the widest frequency range, the lowest power consumption, the best stability and the shortest lead time for consumer, networking, industrial and other applications.

For the same device in an SMD packages, refer to the SiT8008B oscillator.

Program oscillators to get instant samples, optimized performance, and fast prototyping | Learn More

View related products: 115 to 137 MHz | QFN package-40 to +125°C-55 to +125°C | Automotive | XO lineup

Leaded SOT23 package for best board-level reliability, inspection, and manufacturability
Oscillator Type XO-SE
Frequency 1 to 110 MHz
Frequency Stability (ppm) ±20, ±25, ±50
Phase Jitter (rms) 1.3 ps
Output Type LVCMOS
Operating Temperature Range (°C) -20 to +70, -40 to +85
FlexEdgeTM Rise/Fall Time Yes
Voltage Supply (V) 1.8, 2.5 to 3.3
Package Type (mm²) SOT23 (2.9x2.8)
Features Field programmable, SOT23-5
Availability Production

Configurable feature sets

  • Any frequency between 1 to 110 MHz with 6 decimal places of accuracy
  • Stability from ±20 ppm to ±50 ppm
  • Industrial or extended commercial temp.
  • 1.8 V or 2.5 V to 3.3 V supply voltage:
  • Customize specification for optimal system performance
  • Use same base device for many design, reducing qualification needs;

SOT23 package

  • Lowest cost package
  • Best board-level solder joint reliability
  • Easy optical only board-level inspection of solder joints;

FlexEdge™ drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • Saves cost by driving multiple loads and eliminate additional timing components;

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • Mitigate shortage risks

 

  • Ethernet
  • Firewire
  • USB
  • Audio & video
  • SATA/SAS
  • Fibre channel
  • Solid-state drives (SSD)
  • Storage, servers and datacenters
  • Computer servers
  • Processor clocking
  • FPGA clocking
  • Networking switches and gateways
  • CCTV and surveillance equipment
  • Industrial probes and equipment
  • Medical devices
  • Factory automation

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Evaluation Board (Contact SiTime) SiT6097 (2928 SOT23-5)

Time Machine II Programmer – Program frequency, voltage, stability & more

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

SOT 23 5-Pins 3D Step Model – Preview oscillator packages in 3D

Narrow By:

Resource Name Type
SiT2001 3.57MHz LVCMOS Freq. Test Reports
SiT2001 4.096MHz LVCMOS Freq. Test Reports
SiT2001 4MHz LVCMOS Freq. Test Reports
SiT2001 6MHz LVCMOS Freq. Test Reports
SiT2001 7.3728MHz LVCMOS Freq. Test Reports
SiT2001 8.192MHz LVCMOS Freq. Test Reports
SiT2001 10MHz LVCMOS Freq. Test Reports
SiT2001 12MHz LVCMOS Freq. Test Reports
SiT2001 14MHz LVCMOS Freq. Test Reports
SiT2001 18.432MHz LVCMOS Freq. Test Reports
SiT2001 19.2MHz LVCMOS Freq. Test Reports
SiT2001 24.576MHz LVCMOS Freq. Test Reports
SiT2001 25MHz LVCMOS Freq. Test Reports
SiT2001 26MHz LVCMOS Freq. Test Reports
SiT2001 27MHz LVCMOS Freq. Test Reports
SiT2001 28.6363MHz LVCMOS Freq. Test Reports
SiT2001 30MHz LVCMOS Freq. Test Reports
SiT2001 31.25MHz LVCMOS Freq. Test Reports
SiT2001 32.768MHz LVCMOS Freq. Test Reports
SiT2001 33.3MHz LVCMOS Freq. Test Reports
SiT2001 33.33MHz LVCMOS Freq. Test Reports
SiT2001 33.333MHz LVCMOS Freq. Test Reports
SiT2001 33.3333MHz LVCMOS Freq. Test Reports
SiT2001 33MHz LVCMOS Freq. Test Reports
SiT2001 37.5MHz LVCMOS Freq. Test Reports
SiT2001 38.4MHz LVCMOS Freq. Test Reports
SiT2001 38MHz LVCMOS Freq. Test Reports
SiT2001 40.5MHz LVCMOS Freq. Test Reports
SiT2001 40MHz LVCMOS Freq. Test Reports
SiT2001 48MHz LVCMOS Freq. Test Reports
SiT2001 50MHz LVCMOS Freq. Test Reports
SiT2001 54MHz LVCMOS Freq. Test Reports
SiT2001 66.6MHz LVCMOS Freq. Test Reports
SiT2001 66.66MHz LVCMOS Freq. Test Reports
SiT2001 66.666MHz LVCMOS Freq. Test Reports
SiT2001 66.6666MHz LVCMOS Freq. Test Reports
SiT2001 66.66666MHz LVCMOS Freq. Test Reports
SiT2001 72MHz LVCMOS Freq. Test Reports
SiT2001 74.25MHz LVCMOS Freq. Test Reports
SiT2001 74.176MHz LVCMOS Freq. Test Reports
SiT2001 74.175824MHz LVCMOS Freq. Test Reports
SiT2001 75MHz LVCMOS Freq. Test Reports
SiT2001 77.76MHz LVCMOS Freq. Test Reports
SiT2001 100MHz LVCMOS Freq. Test Reports
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
How to Get Instant Oscillators with SiTime's New Field Programmer Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
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Ultra-robust MEMS timing solutions improve performance and reliability in meter applications White Papers
MEMS oscillators improve reliability and system performance in motor control applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
Field Programmable Oscillators Datasheet Datasheets
SiT2001 Datasheet Datasheets
Time Machine II MEMS Oscillator Programmer Product Briefs
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SiT2001 (LVCMOS, 1.8 V) IBIS Models
SiT2001 (LVCMOS, 2.5 V) IBIS Models
SiT2001 (LVCMOS, 2.8 V) IBIS Models
SiT2001 (LVCMOS, 3.0 V) IBIS Models
SiT2001 (LVCMOS, 3.3 V) IBIS Models
SiT2001 (LVCMOS, 2.25 to 3.63 V) IBIS Models
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
SiTime's Time Machine II - Part 1: How to Install Oscillator Programming Software Videos
SiTime's Time Machine II - Part 2: How to Program Field Programmable Oscillators Videos
Training Module: Replacing Crystals with Oscillators Videos
SOT 23 5-Pins 3D Step Models
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
Timing Solutions for Industrial Brochures/Fliers
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
SiTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes