LEO Satellite Communications

LEO Satellite Communications

LEO satellites provide lower latency and higher bandwidth. To achieve this, they depend on ruggedized reference clocks for uplink/downlink comms and clocking the processor. These timing components must withstand high levels of vibration during launch and continued extreme temperature variations in orbit. If timing fails, receivers lose lock to satellites and navigation systems won’t receive critical data.

SiTime ruggedized Endura™ timing solutions are built to operate in harsh environments, overcoming the inherent weaknesses of quartz and delivering low failure rates, long-term reliability, and robust performance.

Download Application Brief

SiTime Ruggedized Endura MEMS Timing Benefits

Precision Timing

50x better acceleration sensitivity

±0.5 ppm up to 105°C

No activity dips

Most Robust in Harsh Conditions

20x better mechanical shock survivability

4x better vibration resistance

Extended operating temperature range

Higher Reliability

Conforms to MIL-PRF-55310

No quartz reliability issues

No cover or shielding

Land Defense Vehicle Communications block diagramsitime.comSiT934xSiT204xsitime.comSiT514x

Endura MEMS Timing Solutions for LEO Satcom

Devices Frequency Frequency Stability Function Key Features

SiT5146 Super-TCXO

SiT5147 Super-TCXO

1 to 60 MHz

60 to 220 MHz

±0.5 to ±2.5 ppm Reference clock for uplink/downlink comms 0.004 ppb/g, ±15 ppb/°C

SiT9346 Differential XO

SiT9347 Differential XO

1 to 220 MHz

220 to 725 MHz

±10 to ±50 ppm DSP, FPGA & processor clocking 0.1 ps RMS phase jitter



1 to 110 MHz

115 to 137 MHz

±20 to ±50 ppm -55°C to 125°C

Endura Timing Outperforms Quartz


Lower Acceleration (g) Sensitivity

Image: Aging graphs Image: Acceleration (g) Sensitivity graphs

Endura Timing Outperforms Quartz

SiTime   Quartz

Acceleration Sensitivity

Image: MEMS vs Quartz Acceleration Sensitivity comparison


Mechanical Shock

Image: MEMS vs Quartz Mechanical Shock comparison



Image: MEMS vs Quartz Quality comparison


Reliability MTBF (Million Hours)

Image: MEMS vs Quartz Reliability MTBF comparison


Tested in Accordance with MIL Specifications

MIL-PRF-55310 Test Single-ended XO Differential XO/VCXO/DCXO TCXO Shock g-Sensitivity Frequency aging g-Sensitivity, constant acceleration Phase noise under vibration Frequency-temperature stability with hysteresis Ambient pressure Allan deviation n/a n/a Frequency-temperature stability with hysteresis and trim effect n/a
3.6.15 Retrace n/a n/a Modulation frequency response n/a Acceleration survivability
3.6.7 Frequency warm up n/a n/a
contact support 2

Need samples or more information?

Request Samples Contact Sales Contact Support