LEO Satellite Communications

Image: Satellite on the orbit

LEO satellites provide lower latency and higher bandwidth. To achieve this, they depend on ruggedized reference clocks for uplink/downlink comms and clocking the processor. These timing components must withstand high levels of vibration during launch and continued extreme temperature variations in orbit. If timing fails, receivers lose lock to satellites and navigation systems won’t receive critical data.

SiTime ruggedized Endura™ timing solutions are built to operate in harsh environments, overcoming the inherent weaknesses of quartz and delivering low failure rates, long-term reliability, and robust performance.

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SiTime Ruggedized Endura MEMS Timing Benefits

Precision Timing

50x better acceleration sensitivity

±0.5 ppm up to 105°C

No activity dips

Most Robust in Harsh Conditions

20x better mechanical shock survivability

4x better vibration resistance

Extended operating temperature range

Higher Reliability

Conforms to MIL-PRF-55310

No quartz reliability issues

No cover or shielding

LEO Satellite Communications Block Diagram

Endura MEMS Timing Solutions for LEO Satcom

Devices Key Features Key Values
SiT5146  1 to 60 MHz
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SiT5147  60 to 220 MHz
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  • ±0.5 to ±2.5 ppm stability
  • 0.004 ppb/g, ±15 ppb/°C
Reference clock for uplink/downlink comms
Differential XO
SiT9346  1 to 220 MHz
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SiT9347  220 to 725 MHz
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  • ±10 to ±50 ppm stability
  • 0.1 ps RMS phase jitter
DSP, FPGA & processor clocking
SiT2044  1 to 110 MHz
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SiT2045  115 to 137 MHz
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  • ±20 to ±50 ppm stability
  • -55°C to 125°C
DSP, FPGA & processor clocking

Endura Timing Outperforms Quartz


Lower Acceleration (g) Sensitivity

SiTime – Best-in-Class Aging
SiTime – Lower Acceleration (g) Sensitivity

Endura Timing Outperforms Quartz

SiTime   Quartz


Acceleration Sensitivity

MEMS Outperforms Quartz – Acceleration Sensitivity

Mechanical Shock

MEMS Outperforms Quartz – Mechanical Shock


MEMS Outperforms Quartz – Quality

Reliability MTBF (Million Hours)

MEMS Outperforms Quartz – Reliability MTBF (Million Hours)

Tested in Accordance with MIL Specifications

MIL-PRF-55310 Test Single-ended XO Differential XO/VCXO/DCXO TCXO Shock g-Sensitivity Frequency aging g-Sensitivity, constant acceleration Phase noise under vibration Frequency-temperature stability with hysteresis Ambient pressure Allan deviation n/a n/a Frequency-temperature stability with hysteresis and trim effect n/a
3.6.15 Retrace n/a n/a Modulation frequency response n/a Acceleration survivability
3.6.7 Frequency warm up n/a n/a
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