Standard Frequency Ultra-low Jitter Differential XO

The SiT9365 ultra-low-jitter differential oscillator supports 32 commonly used output frequencies for networking, storage, server, and FPGA clocking. Based on SiTime's unique Elite Platform™, this device delivers exceptional dynamic performance of 0.23 ps jitter (typ.) and stable timing in the presence of common environmental hazards, such as shock, vibration, power supply noise, and EMI.

The SiT9365 is available in the smallest 3.2 x 2.5 mm differential package in addition to the 7.0 x 5.0 mm package. This device supports all popular output signaling types including LVPECL, LVDS, and HCSL in combination with any voltage between 2.5 to 3.3 V.

View related products: 1 to 60 MHz | 60 to 220 MHz |  70 fs jitter | 200 fs jitter Ruggedized | XO lineup

Small industry standard package enables small form-factor system with stringent jitter requirement
Oscillator Type XO-DE
Frequency 32 standard frequencies
Frequency Stability (ppm) ±10 , ±20, ±25, ±50
Phase Jitter (rms) 0.23 ps
Output Type LVPECL, LVDS, HCSL
Operating Temperature Range (°C) -20 to +70, -40 to +85, -40 to +105
Voltage Supply (V) 2.5, 2.8, 3, 3.3
Package Type (mm²) 3.2x2.5, 5.0x3.2, 7.0x5.0
Features Ultra-low jitter
Availability Production

Exceptional dynamic performance in real-life operating conditions

  • 0.23 ps jitter (typ.)
  • ±10 ppm
  • Better system performance in hostile environments

20x better vibration sensitivity

  • Minimizes packet loss in high-vibration environments

0.05 ps/mV power supply noise rejection (PSNR)

  • Simplify power supply design

3.2 x 2.5 mm package:

  • Enables small form-factor system with stringent jitter requirement

Flexible programmable features

  • 32 common frequencies
  • 2.25 to 3.63 V
  • LVPECL, LVDS, HCSL: Customized oscillator specifications for optimal system performance

Superior reliability

  • 1 billion hours MTBF
  • Lifetime warranty
  • Reduces field failures due to clock components and associated repair costs

 

  • 10G to 100G Ethernet
  • Optical modules
  • PCIe
  • FPGA
  • SATA/SAS
  • Fibre channel
  • System clocking
  • CPE & home gateway
  • Data centers

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Eval Boards (Contact SiTime) – SiT6097 (3225) | SiT6085 (7050)

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

Jitter Calculator and Plots – Convert phase noise to phase jitter, find phase noise plots

Reliability Calculator – Get FIT/MTBF data for various operating conditions

3225 6-Pins | 5032 6-Pins with CP | 7050 6-Pins with CP – Preview packages with QFN 3D step models

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Resource Name Type
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (S. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (T. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (Korean) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs FAQs
Elite Platform - Transforming the Telecom and Networking Timing Market (Korean) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (S. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (T. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market Presentations
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) Product Briefs
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Japanese) Product Briefs
MEMS oscillators improve reliability and system performance in motor control applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
SiT9365 Datasheet Datasheets
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SiT9365 25MHz HCSL Freq. Test Reports
SiT9365 30.72MHz HCSL Freq. Test Reports
SiT9365 50MHz HCSL Freq. Test Reports
SiT9365 53.125MHz HCSL Freq. Test Reports
SiT9365 61.44MHz HCSL Freq. Test Reports
SiT9365 98.304MHz HCSL Freq. Test Reports
SiT9365 100MHz HCSL Freq. Test Reports
SiT9365 106.25MHz HCSL Freq. Test Reports
SiT9365 122.88MHz HCSL Freq. Test Reports
SiT9365 125MHz HCSL Freq. Test Reports
SiT9365 133.333333MHz HCSL Freq. Test Reports
SiT9365 148.351648MHz HCSL Freq. Test Reports
SiT9365 150MHz HCSL Freq. Test Reports
SiT9365 153.6MHz HCSL Freq. Test Reports
SiT9365 155.52MHz HCSL Freq. Test Reports
SiT9365 156.25MHz HCSL Freq. Test Reports
SiT9365 159.375MHz HCSL Freq. Test Reports
SiT9365 160MHz HCSL Freq. Test Reports
SiT9365 161.132813MHz HCSL Freq. Test Reports
SiT9365 166.666666MHz HCSL Freq. Test Reports
SiT9365 168.040678MHz HCSL Freq. Test Reports
SiT9365 200MHz HCSL Freq. Test Reports
SiT9365 212.5MHz HCSL Freq. Test Reports
SiT9365 250MHz HCSL Freq. Test Reports
SiT9365 300MHz HCSL Freq. Test Reports
SiT9365 322.265625MHz HCSL Freq. Test Reports
SiT9365 325MHz HCSL Freq. Test Reports
SiT9365 30.72MHz LVDS Freq. Test Reports
SiT9365 53.125MHz LVDS Freq. Test Reports
SiT9365 61.44MHz LVDS Freq. Test Reports
SiT9365 62.5MHz LVDS Freq. Test Reports
SiT9365 74.25MHz LVDS Freq. Test Reports
SiT9365 74.175824MHz LVDS Freq. Test Reports
SiT9365 75MHz LVDS Freq. Test Reports
SiT9365 77.76MHz LVDS Freq. Test Reports
SiT9365 98.304MHz LVDS Freq. Test Reports
SiT9365 100MHz LVDS Freq. Test Reports
SiT9365 106.25MHz LVDS Freq. Test Reports
SiT9365 122.88MHz LVDS Freq. Test Reports
SiT9365 125MHz LVDS Freq. Test Reports
SiT9365 133.333333MHz LVDS Freq. Test Reports
SiT9365 148.351648MHz LVDS Freq. Test Reports
SiT9365 150MHz LVDS Freq. Test Reports
SiT9365 153.6MHz LVDS Freq. Test Reports
SiT9365 155.52MHz LVDS Freq. Test Reports
SiT9365 156.25MHz LVDS Freq. Test Reports
SiT9365 159.375MHz LVDS Freq. Test Reports
SiT9365 160MHz LVDS Freq. Test Reports
SiT9365 161.132813MHz LVDS Freq. Test Reports
SiT9365 166.666666MHz LVDS Freq. Test Reports
SiT9365 168.040678MHz LVDS Freq. Test Reports
SiT9365 200MHz LVDS Freq. Test Reports
SiT9365 212.5MHz LVDS Freq. Test Reports
SiT9365 250MHz LVDS Freq. Test Reports
SiT9365 300MHz LVDS Freq. Test Reports
SiT9365 322.265625MHz LVDS Freq. Test Reports
SiT9365 325MHz LVDS Freq. Test Reports
SiT9365 25MHz LVPECL Freq. Test Reports
SiT9365 30.72MHz LVPECL Freq. Test Reports
SiT9365 50MHz LVPECL Freq. Test Reports
SiT9365 53.125MHz LVPECL Freq. Test Reports
SiT9365 61.44MHz LVPECL Freq. Test Reports
SiT9365 62.5MHz LVPECL Freq. Test Reports
SiT9365 74.25MHz LVPECL Freq. Test Reports
SiT9365 74.175824MHz LVPECL Freq. Test Reports
SiT9365 75MHz LVPECL Freq. Test Reports
SiT9365 77.76MHz LVPECL Freq. Test Reports
SiT9365 98.304MHz LVPECL Freq. Test Reports
SiT9365 100MHz LVPECL Freq. Test Reports
SiT9365 106.25MHz LVPECL Freq. Test Reports
SiT9365 122.88MHz LVPECL Freq. Test Reports
SiT9365 125MHz LVPECL Freq. Test Reports
SiT9365 133.333333MHz LVPECL Freq. Test Reports
SiT9365 148.351648MHz LVPECL Freq. Test Reports
SiT9365 150MHz LVPECL Freq. Test Reports
SiT9365 153.6MHz LVPECL Freq. Test Reports
SiT9365 155.52MHz LVPECL Freq. Test Reports
SiT9365 156.25MHz LVPECL Freq. Test Reports
SiT9365 159.375MHz LVPECL Freq. Test Reports
SiT9365 160MHz LVPECL Freq. Test Reports
SiT9365 161.132813MHz LVPECL Freq. Test Reports
SiT9365 166.666666MHz LVPECL Freq. Test Reports
SiT9365 168.040678MHz LVPECL Freq. Test Reports
SiT9365 200MHz LVPECL Freq. Test Reports
SiT9365 212.5MHz LVPECL Freq. Test Reports
SiT9365 250MHz LVPECL Freq. Test Reports
SiT9365 300MHz LVPECL Freq. Test Reports
SiT9365 322.265625MHz LVPECL Freq. Test Reports
SiT9365 325MHz LVPECL Freq. Test Reports
AN10029 Output Terminations for Differential Oscillators Application Notes
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization Product Briefs
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
AN10061 Inphi PAM4 Performance when Driving Shared Reference Clocks Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
Phase Noise Measurement Tutorial Videos
SiT9365 (HCSL, 3.3 V) IBIS Models
SiT9365 (HCSL, 2.5 V) IBIS Models
SiT9365 (LVDS, 3.3 V) IBIS Models
SiT9365 (LVDS, 2.5 V) IBIS Models
SiT9365 (LVPECL, 3.3 V) IBIS Models
SiT9365 (LVPECL, 2.5 V) IBIS Models
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Jitter Part 1: Principles and Practice with an Overview of Period Jitter Videos
Jitter Part 2: Phase Noise and Phase Jitter Videos
Jitter Part 3: C2C Jitter and Long Term Jitter Videos
QFN 3225 6-Pins 3D Step Models
QFN 5032 6-Pins with CP 3D Step Models
QFN 7050 6-Pins with CP 3D Step Models
AN10066 LVDS Output with 600 mV to 1200 mV Swing Application Notes
Timing Solutions for Industrial Brochures/Fliers
Smart Network Interface Card (NIC) and IEEE1588 Application Briefs
100G/200G/400G/800G Optical Modules Application Briefs
SiTime MEMS Timing Solutions for Optical Module Videos
Fronthaul and IP RAN Switches Application Briefs
SiTime MEMS Timing Solutions for Servers Videos
SiTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes