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Ultra-Small Low-Jitter, 32.768-kHz ±100-ppm Oscillator
LoginBuilt on SiTime's TempFlat MEMS™ technology, this 32-kHz ±100-ppm (al-inclusive frequency stability) oscillator comes in an ultra-small 1.2mm2 chip-scale package. Typical supply current is only 4.5 μA. This device can drive 2 to 3 loads and replace multiple quartz crystals, reducing the BOM and board space. And unlike crystals, it doesn’t require external bypass capacitors.
View related products: 1.2 V operation | 32 kHz lineup
| "Specs" | "Value" |
|---|---|
| Oscillator Type | 32-kHz XO |
| Frequency | 32.768 kHz |
| Frequency Stability (ppm) | ±100 |
| Output Type | LVCMOS |
| Operating Temperature Range (°C) | -40 to +85 |
| Voltage Supply (V) | 1.62 to 3.63 |
| Package Type (mm²) | 1.5x0.8 |
| Features | Ultra-low power |
| Availability | Sampling |
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Image: SiT1573 1508 4-pin package, top & bottom
±100 ppm all-inclusive frequency stability
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Improved local timekeeping and improved system power with less dependency on network timekeeping updates
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Improved system error budget
Smallest footprint in chip-scale package (CSP): 1.5 x 0.8 mm
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Saves board space
Ultra-low power: 4.5 µA (typ.)
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Maximizes battery life
Low jitter: 4 ns RMS integrated phase jitter (IPJ)
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Suitable for audio applications
Internal VDD supply filtering
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Eliminates external VDD bypass capacitor to maintain ultra-small footprint
Drives multiple loads
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Eliminates multiple discrete XTALs and load caps
- Wireless connectivity sleep clock
- Retail electronics
- RTC reference clock
- Data connectivity
- Consumer electronics
- Fitness tracker
- ULP input devices
- Mobile accessories
Reliability Calculator – Get FIT/MTBF data for various operating conditions
| Resource Name | Type |
|---|---|
| AN10006 Best Design and Layout Practices | Application Notes |
| AN10025 Reliability Calculations for SiTime Oscillators | Application Notes |
| Timing Solutions for Mobile & IoT | Brochures/Fliers |
| Silicon Replaces Quartz (Japanese Subtitles) | Videos |
| Silicon Replaces Quartz (Chinese Subtitles) | Videos |
| SiT1573 Datasheet | Datasheets |
| SiTime MEMS First 工艺 | Technology Papers |
| SiTime MEMS First 工艺 | Misc. Resources |
| AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter | Application Notes |
| AN10071 Computing TIE Crest Factors for Telecom Applications | Application Notes |
| AN10070 Computing TIE Crest Factors for Non-telecom Applications | Application Notes |
| AN10072 Determine the Dominant Source of Phase Noise, by Inspection | Application Notes |
| AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements | Application Notes |
