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SiT2019A: High-Frequency, High-Temperature Single-Chip, One-Output Clock Generator
LoginThe SiT2019 is the industry's first high-frequency, high-temperature, one-output clock generator with an embedded MEMS resonator. This device features an uncompromising combination of low power consumption, excellent stability, flexible supply voltage, and the shortest lead time for high frequency applications. It comes in a small, 5-pin SOT23-5 package that offers the best board-level solder joint reliability and enables low cost, optical-ONLY board-level inspection. Download datasheet.
"Specs" | "Value" |
---|---|
Recommendations | Not recommended for new designs |
Replacement Part | SiT2019 |
Document Name | Type |
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Manufacturing Notes for SiTime Products | Other Quality Documents |
SiTime Conflict Minerals Policy | Other Quality Documents |
ISO9001:2015 Certificate of Registration | Other Quality Documents |
Resource Name | Type |
---|---|
AN10025 Reliability Calculations for SiTime Oscillators | Application Notes |
AN10062 Phase Noise Measurement Guide for Oscillators | Application Notes |
SiTime MEMS Timing Solutions (8.5x11) | Brochures/Fliers |
SiTime MEMS Timing Solutions (A4) | Brochures/Fliers |
SiTime MEMS Timing Solutions (A4) Chinese | Brochures/Fliers |
Silicon Replaces Quartz (Japanese Subtitles) | Videos |
Silicon Replaces Quartz (Chinese Subtitles) | Videos |
SiTime MEMS First 工艺 | Technology Papers |
SiTime MEMS First 工艺 | Misc. Resources |
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter | Application Notes |
AN10071 Computing TIE Crest Factors for Telecom Applications | Application Notes |
AN10070 Computing TIE Crest Factors for Non-telecom Applications | Application Notes |
AN10072 Determine the Dominant Source of Phase Noise, by Inspection | Application Notes |
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements | Application Notes |