SIT5711AICKW-33N-25.000000

SIT5711AICKW-33N-25.000000

Specs Value
Device Type Stratum 3E OCXOs
Frequency
25 MHz
Frequency Stability (ppm)
±0.005
Operating Temp. Range (°C)
-40 to 85
Supply Voltage (V)
3.3
Package Size (mm x mm)
9.0x7.0
Output Drive Strength*
Clipped Sinewave
Feature Pin
No Connect

*See datasheet for details

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10 times better dynamic stability under airflow and fast temp. ramp, ensures best system performance in harsh environments

  • ±5 or ±8 ppb over-temp. stability
  • 2e-11 ADEV at 10 sec under airflow
  • ±40 ppt/°C frequency slope (ΔF/ΔT)

Unmatched ease-of-use, simplifying system design

  • No restrictions on PCB placement
  • No mechanical shielding needed for thermal isolation
  • Resistant to humidity
  • On-chip regulators, no need for external LDOs or ferrite beads

Smallest size, ideal for high density and small form factor systems

  • 9 x 7 mm footprint, 75% smaller
  • 6.5 mm height, 40% thinner

Higher reliability and robustness

  • 20 times better vibration resistance, ideal for outdoor pole mounted equipment
  • Resistant to microphonic and/or board bending effects, ideal for large telecom PCBs
  • Semiconductor-level quality and reliability, batch to batch consistency
  • No activity dips or micro jumps

Programmable platform eliminates long lead times and customization cost associated with legacy quartz OCXO

  • Any frequency from 1 to 60 MHz
  • LVCMOS or clipped sine-wave outputs 
  • SONET/SDH Stratum 3E
  • 4G/5G RRH, DU
  • Base Stations
  • Core and edge routers
  • Carrier class switches
  • IEEE 1588 boundary clocks
  • IEEE 1588 grandmasters
  • GNSS disciplined timing modules
  • Instrumentation
  • Power & energy
  • Defense & aerospace
  • Long-range communications

Narrow By:

SiT6731 Eval Board User Manual – Evaluate oscillator performance

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

Jitter Calculator and Plots – Convert phase noise to phase jitter, find phase noise plots

Time Error Simulation Software – Simulate and analyze the impact of the local oscillator

Reliability Calculator – Get FIT/MTBF data for various operating conditions

Emerald 9x7mm 3D Step Model – Preview oscillator packages in 3D

Narrow By:

Resource Name Type
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
AN10028 Probing Oscillator Output Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
SC-AN10033 振荡器频率测量指南 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
Emerald Platform™ Stratum 3E OCXOs Product Briefs
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
AN10063 TCXO and OCXO Stability Degradation Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Network Evolution 5G - Timing and Synchronization Videos
OCXO 9.0 mm x 7.0 mm 10-Pins 3D Step Models
SiT6731EB Evaluation Board User Manual User Manuals
Adaptive Drift Compensation for Holdover Oscillators White Papers
Time Error Simulation - Software and Models White Papers
How to Design with SiTime TCXOs and OCXOs Videos
Timing Solutions for Industrial Brochures/Fliers
Fronthaul Switches Application Briefs
Microwave Outdoor Units (ODU) Application Briefs
Open RAN (ORAN) – Macro and Small Cells Application Briefs
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Misc. Resources
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
Top of Rack Switch / Leaf Switch Application Briefs
ORAN Distributed Unit Application Briefs
GNSS Disciplined Systems Application Briefs
Test and Measurement Application Briefs
SiTime MEMS Timing Solutions for SmartNICs Videos
SiTime MEMS Timing Solutions for Data Centers Videos
SiT5711 Datasheet Datasheets
  • SIT5711AICKW-33N-25.000000Y
  • SIT5711AICKW-33N-25.000000T
  • SIT5711AICKW-33N-25.000000D
  • SIT5711AICKW-33N-25.000000E
  • SIT5711AICKW-33N-25.000000X
  • SIT5711AICKW-33N-25.000000N
  • SIT5711AICKW-33N-25.000000F
  • SIT5711AICKW-33N-25.000000G
  • SIT5711AICKW-33N-25.000000S
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