SiT5356AI-FQ-30E0-10.000000

Datasheet
Image: Elite TCXO Ceramic 5032 10-pin package, top & bottom

SiT5356AI-FQ-30E0-10.000000

Device Type Super-TCXOs
Frequency
10 MHz
Frequency Stability (ppm)
±0.1
Operating Temp. Range (°C)
-40 to 85
Supply Voltage (V)
3.0
Package Size (mm x mm)
5.0x3.2
Output Drive Strength*
LVCMOS
Feature Pin
TCXO OE
Pull Range (PPM PR)
±0

*See datasheet for details

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Unit Pricing
Unit Count Unit Cost
1 - 99 $63.714
100 - 499 $50.681
500 - 999 $40.111
1,000 - 4,999 $35.478
>4,999 Contact Us
In Stock: 19 pieces
Available for sale in tape & reel packaging only. To order quantities greater than 5,000, please contact SiTime Sales or use the Chat below.
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  • Image: Elite TCXO Ceramic 5032 10-pin package, top & bottom
    enlarge

    Image: Elite TCXO Ceramic 5032 10-pin package, top & bottom

  • SiT5356 pin assignments
    enlarge

    SiT5356 pin assignments

  • SiT5356 block diagram
    enlarge

    SiT5356 block diagram

Exceptional dynamic stability under airflow, fast temp. ramp

  • ±100 ppb over-temp. stability
  • 3e-11 ADEV at 10 second average time
  • ±1 ppb/°C frequency slope (ΔF/ΔT), 10 °C/min ramp
    • Ensures system-level quality of service for telecom and networking equipment in hostile environments

20x better phase noise under vibration

  • Minimizes call and/or link drops in high-vibration environments

No activity dips or microjumps

  • Eliminates any need for costly screening or burn-in tests

0.2 ps/mV power supply noise rejection (PSNR)

  • Reduces BOM by eliminating a dedicated LDO for TCXO

LVCMOS or Clipped sinewave output

  • Optimizes for best balance between EMI and jitter

Rich programmable features

  • Any frequency between 1 to 60 MHz
  • 2.25 to 3.63 V
  • Large pull range from ±6.25 to ±3200 ppm
    • Customize TCXO specifications for optimal system performance

Digital frequency tuning through I2C

  • Eliminate frequency shift caused by board noise

Superior reliability

  • 1 billion hours MTBF
  • Lifetime Warranty: Reduces repair costs and field failures due to clock components

 

  • SONET/SDH Stratum 3
  • Synchronous Ethernet (G.8262, options 1 and 2)
  • Small cells
  • IEEE 1588 boundary clocks and grandmasters
  • Optical transport (OTN, OLT, etc.)
  • Cable model termination system (CMTS)
  • COSPAS/SARSAT
  • Broadband satellite
  • Instrumentation
  • Serial-data links
  • Wireless & backhaul
  • Fiber, cable, DSL
  • Precision GNSS
  • LiDAR & Radar
  • GPS/GNSS modules
  • Smart meters
  • Defense & aerospace
  • Railroads
  • Long-range communications
  • Asset tracking
  • Indoor positioning
  • Smart farming
  • Smart city

Narrow By:

Document Name Type
10L-Ceramic Package Composition Report (Elite SiT51xx, SiT53xx TCXO) Composition Reports
Electronics Industry Citizen Coalition Template Other Quality Documents
Manufacturing Notes for SiTime Products Other Quality Documents
SiTime Conflict Minerals Policy Other Quality Documents
SiTime Environmental Policy Other Quality Documents
SiTime Warranty on Date Code Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
10L-Ceramic Package Reliability Report Reliability Reports
SiT515X, SiT535X Product Qualification Report Reliability Reports
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
Tower Jazz Wafer SGS Report RoHS/Reach/Green Certificates
4L/6L-QFN Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
BOSCH Wafer SGS Report RoHS/Reach/Green Certificates
SiTime Environmental Compliance Declaration RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates
10L Ceramic (Elite TCXO) RoHSCert Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates

SiT6722 (5032) Eval Board User Manual – Evaluate oscillator performance

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

Jitter Calculator & Plots – Convert phase noise to phase jitter, find phase noise plots

Time Error Simulation Software – Simulate and analyze the impact of the local oscillator

TimeMaster Configuration Software – Configure and evaluate oscillators via I2C/SP

Reliability Calculator – Get FIT/MTBF data for various operating conditions

Ceramic 5032 10-Pins 3D Step Model – Preview oscillator packages in 3D

Narrow By:

Resource Name Type
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Elite Super-TCXOs for GNSS Applications (Chinese) Product Briefs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (S. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (T. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (Korean) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs FAQs
Elite Platform - Transforming the Telecom and Networking Timing Market (Korean) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (S. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (T. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market Presentations
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) Product Briefs
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Japanese) Product Briefs
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
SiT5356 Datasheet Datasheets
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較（耐衝撃と耐振動） Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
J-AN10039 TCXOの周波数安定性および周波数精度バジェット Application Notes
AN10039 TCXO Frequency Stability and Frequency Accuracy Budget Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
Synchronization System Performance Benefits of Precision MEMS TCXOs under Environmental Stress Conditions Technology Papers
SiT6722EB Evaluation Board User Manual User Manuals
Elite Super-TCXOs for GNSS Applications Product Briefs
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization Product Briefs
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
SiT5356 10.949297MHz LVCMOS Freq. Test Reports
SiT5356 10MHz LVCMOS Freq. Test Reports
SiT5356 12.288MHz LVCMOS Freq. Test Reports
SiT5356 16.368MHz LVCMOS Freq. Test Reports
SiT5356 16.369MHz LVCMOS Freq. Test Reports
SiT5356 16.384MHz LVCMOS Freq. Test Reports
SiT5356 16.3676MHz LVCMOS Freq. Test Reports
SiT5356 16.367667MHz LVCMOS Freq. Test Reports
SiT5356 19.2MHz LVCMOS Freq. Test Reports
SiT5356 20MHz LVCMOS Freq. Test Reports
SiT5356 24.576MHz LVCMOS Freq. Test Reports
SiT5356 24.5535MHz LVCMOS Freq. Test Reports
SiT5356 24MHz LVCMOS Freq. Test Reports
SiT5356 25MHz LVCMOS Freq. Test Reports
SiT5356 26MHz LVCMOS Freq. Test Reports
SiT5356 30.72MHz LVCMOS Freq. Test Reports
SiT5356 38.4MHz LVCMOS Freq. Test Reports
SiT5356 38.88MHz LVCMOS Freq. Test Reports
SiT5356 40MHz LVCMOS Freq. Test Reports
SiT5356 10.949297MHz Clipped Sinewave Freq. Test Reports
SiT5356 10MHz Clipped Sinewave Freq. Test Reports
SiT5356 12.288MHz Clipped Sinewave Freq. Test Reports
SiT5356 16.368MHz Clipped Sinewave Freq. Test Reports
SiT5356 16.369MHz Clipped Sinewave Freq. Test Reports
SiT5356 16.384MHz Clipped Sinewave Freq. Test Reports
SiT5356 16.3676MHz Clipped Sinewave Freq. Test Reports
SiT5356 16.367667MHz Clipped Sinewave Freq. Test Reports
SiT5356 19.2MHz Clipped Sinewave Freq. Test Reports
SiT5356 20MHz Clipped Sinewave Freq. Test Reports
SiT5356 24.576MHz Clipped Sinewave Freq. Test Reports
SiT5356 24.5535MHz Clipped Sinewave Freq. Test Reports
SiT5356 24MHz Clipped Sinewave Freq. Test Reports
SiT5356 25MHz Clipped Sinewave Freq. Test Reports
SiT5356 26MHz Clipped Sinewave Freq. Test Reports
SiT5356 30.72MHz Clipped Sinewave Freq. Test Reports
SiT5356 38.4MHz Clipped Sinewave Freq. Test Reports
SiT5356 38.88MHz Clipped Sinewave Freq. Test Reports
SiT5356 40MHz Clipped Sinewave Freq. Test Reports
Tough 5G Timing Requires MEMS Clock Sources White Papers
Timing Solutions for Communications & Enterprise Brochures/Fliers
AN10063 TCXO and OCXO Stability Degradation Application Notes
Phase Noise Measurement Tutorial Videos
Whack an Oscillator Demo Videos
SiT5356 (LVCMOS, 3.3 V) IBIS Models
SiT5356 (LVCMOS, 2.5 V) IBIS Models
SiT5356 (CSINE, 3.3 V) IBIS Models
SiT5356 (CSINE, 2.5 V) IBIS Models
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
AN10064 Improved System Performance with Digital Frequency Tuning in Precision Super-TCXOs Application Notes
SiT6702DM Demo Board User Manual User Manuals
Advantages of MEMS Timing - Parameters Videos
Elite Super-TCXO Improves GNSS Robustness Videos
Elite Super-TCXO Improves Performance of IEEE 1588 Applications Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Network Evolution 5G - Timing and Synchronization Videos
Ceramic 5032 10-Pins 3D Step Models
SiT6702DM Demo Board Quick Start Guide User Manuals
Time Error Simulation - Software and Models White Papers
How to Design with SiTime TCXOs and OCXOs Videos
Smart Network Interface Card (NIC) and IEEE1588 Application Briefs
Servers Load Balancing and IEEE1588 Support Application Briefs
5G New Radio (NR) – RRU, AAU, Massive MIMO Application Briefs
Fronthaul Switches Application Briefs
Microwave Outdoor Units (ODU) Application Briefs
Open RAN (ORAN) – Macro and Small Cells Application Briefs
Elite Precision Super-TCXOs Solve Networking and Telecom Timing Issues Videos
SiTime MEMS Timing Solutions for Servers Videos
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Misc. Resources
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
Top of Rack Switch / Leaf Switch Application Briefs
GNSS Disciplined Systems Application Briefs
Factory Automation Application Briefs
Industrial Robotics Application Briefs
SiTime MEMS Timing Solutions for SmartNICs Videos
SiTime MEMS Timing Solutions for Data Centers Videos
耐久性を必要とする５GタイミングにはMEMSクロックソースが必須 White Papers
Oscilloscopes & Spectrum Analyzers Application Briefs
Audio / Video – Broadcasting Equipment Application Briefs
Industrial Energy Storage Systems (ESS) Application Briefs
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