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"Specs" | "Value" |
---|---|
Recommendations | Not recommended for new designs |
Replacement Part | SiT8209 |
Document Name | Type |
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Manufacturing Notes for SiTime Products | Other Quality Documents |
SiTime Conflict Minerals Policy | Other Quality Documents |
Resource Name | Type |
---|---|
SiTime MEMS First 工艺 | Technology Papers |
SiTime MEMS First 工艺 | Misc. Resources |
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter | Application Notes |
AN10071 Computing TIE Crest Factors for Telecom Applications | Application Notes |
AN10070 Computing TIE Crest Factors for Non-telecom Applications | Application Notes |
AN10072 Determine the Dominant Source of Phase Noise, by Inspection | Application Notes |
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements | Application Notes |