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| "Specs" | "Value" |
|---|---|
| Recommendations | Not recommended for new designs |
| Replacement Part | SiT8209 |
| Document Name | Type |
|---|---|
| Manufacturing Notes for SiTime Products | Other Quality Documents |
| SiTime Conflict Minerals Policy | Other Quality Documents |
| Resource Name | Type |
|---|---|
| SiTime MEMS First 工艺 | Technology Papers |
| SiTime MEMS First 工艺 | Misc. Resources |
| AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter | Application Notes |
| AN10071 Computing TIE Crest Factors for Telecom Applications | Application Notes |
| AN10070 Computing TIE Crest Factors for Non-telecom Applications | Application Notes |
| AN10072 Determine the Dominant Source of Phase Noise, by Inspection | Application Notes |
| AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements | Application Notes |
