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SiT2025A: AEC-Q100, High-Frequency Clock Generator with -55 to 125°C Temp. Range
LoginThe SiT2025 is the industry's first AEC-Q100 compliant, high-frequency clock generator with on-chip MEMS resonator, therefore eliminating any need for external crystals and other clock sources. This device delivers the perfect of high frequency range (up to 137 MHz), excellent stability (±50 ppm) and extreme temperature range (-55 to 125°C). It also features the industry's best 01 ppb/g vibration sensitivity, 50,000 g shock and 70 g vibration resistance. Download datasheet.
| "Specs" | "Value" |
|---|
| Document Name | Type |
|---|---|
| Manufacturing Notes for SiTime Products | Other Quality Documents |
| SiTime Conflict Minerals Policy | Other Quality Documents |
| ISO9001:2015 Certificate of Registration | Other Quality Documents |
| Resource Name | Type |
|---|---|
| AN10025 Reliability Calculations for SiTime Oscillators | Application Notes |
| SiTime MEMS Timing Solutions (8.5x11) | Brochures/Fliers |
| SiTime MEMS Timing Solutions (A4) | Brochures/Fliers |
| SiTime MEMS Timing Solutions (A4) Chinese | Brochures/Fliers |
| Silicon Replaces Quartz (Japanese Subtitles) | Videos |
| Silicon Replaces Quartz (Chinese Subtitles) | Videos |
| SiTime MEMS First 工艺 | Technology Papers |
| SiTime MEMS First 工艺 | Misc. Resources |
| AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter | Application Notes |
| AN10071 Computing TIE Crest Factors for Telecom Applications | Application Notes |
| AN10070 Computing TIE Crest Factors for Non-telecom Applications | Application Notes |
| AN10072 Determine the Dominant Source of Phase Noise, by Inspection | Application Notes |
| AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements | Application Notes |
