SIT3522AI-2C230-SB341.000000

SIT3522AI-2C230-SB341.000000

Specs Value
Device Type I2C/SPI Oscillators
Frequency
341 MHz
Frequency Stability (ppm)
±25
Operating Temp. Range (°C)
-40 to 85
Output Type
LVDS
Supply Voltage (V)
3.0
Package Size (mm x mm)
5.0x3.2
Output Drive Strength*
Default
Feature Pin
OE under software control
Pull Range (PPM PR)
±50

*See datasheet for details

Buy Now

This product ships directly from our factory, please allow 4-6 weeks for delivery.
Unit Pricing
Unit Count Unit Cost
1 - 99 $31.772
100 - 499 $25.273
500 - 999 $20.002
1,000 - 4,999 $17.692
>4,999 Contact Us
Available for sale in cut tape packaging. Some orders with quantities less than 50 pieces may be shipped in ESD zip bags. To order quantities greater than 5,000, please contact SiTime Sales or use the Chat below.
Also purchase from

In-system programmable from 340.000001 MHz and 725 MHz via I2C/SPI

Digital frequency pulling (DCO) via I2C/SPI

  • Output frequency pulling with perfect pull linearity

  • 13 programmable pull range options to ±3200 ppm

  • Frequency pull resolution as low as 5 ppt (0.005 ppb)

Dynamic performance

  • 0.1 ppb/g, superior shock and vibration resistance

  • No activity dips or micro jumps

Integrated LDO for on-chip power supply noise filtering

  • 0.05 ps/mV power supply noise rejection (PSNR)

  • Reduces BOM by eliminating a LDO

Programmable LVPECL, LVDS, or HCSL output

  • Programmable LVPECL, LVDS Swing

  • LVDS Common Mode Voltage Control

  • Optimizes signal integrity

Superior reliability

  • 1 billion hours MTBF

  • Lifetime Warranty: Reduces repair costs and field failures due to clock components

  • 10G to 100G Ethernet
  • SONET
  • Storage, servers and datacenters
  • Test and measurement

Narrow By:

SiT6712 (5032) Evaluation Board User Manual – Evaluate oscillator performance

TimeMaster Configuration Software – Configure and evaluate oscillators via I2C/SP

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

QFN 5032 10-Pins 3D Step Model – Preview oscillator packages in 3D

Narrow By:

Resource Name Type
AN10006 Best Design and Layout Practices Application Notes
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
AN10028 Probing Oscillator Output Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
AN10050 I2C/SPI Programmable Oscillators Application Notes
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
Phase Noise Measurement Tutorial Videos
SiT3522 (HCSL, 3.3 V) IBIS Models
SiT3522 (HCSL, 2.5 V) IBIS Models
SiT3522 (LVDS, 3.3 V) IBIS Models
SiT3522 (LVDS, 2.5 V) IBIS Models
SiT3522 (LVPECL, 3.3 V) IBIS Models
SiT3522 (LVPECL, 2.5 V) IBIS Models
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
SiT6701DM Demo Board User Manual User Manuals
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Jitter Part 1: Principles and Practice with an Overview of Period Jitter Videos
Jitter Part 2: Phase Noise and Phase Jitter Videos
Jitter Part 3: C2C Jitter and Long Term Jitter Videos
QFN 5032 10-Pins 3D Step Models
SiT6701DM Demo Board Quick Start Guide User Manuals
SiT6702DM Demo Board Quick Start Guide User Manuals
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
Timing Solutions for Industrial Brochures/Fliers
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
SiT3522 Datasheet Datasheets
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Application Notes
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
AN23033 Thermal Considerations for SiTime Products Application Notes
Three advantages of MEMS timing technology in industrial automation applications White Papers
  • SIT3522AI-2C230-SB341.000000Y
  • SIT3522AI-2C230-SB341.000000T
  • SIT3522AI-2C230-SB341.000000D
  • SIT3522AI-2C230-SB341.000000E
  • SIT3522AI-2C230-SB341.000000X
  • SIT3522AI-2C230-SB341.000000N
  • SIT3522AI-2C230-SB341.000000F
  • SIT3522AI-2C230-SB341.000000G
  • SIT3522AI-2C230-SB341.000000S
gottseidank