SiTime, Silicon MEMS Oscillators and Clock Generators

Quality and Reliability

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ISO9001:2008
Certificate of Registration

 

SiTime’s Quality Management System (QMS) is based on the ISO 9001:2008 quality system standard and SiTime has received ISO 9001:2008 certification. All our products are designed and brought into production using our robust 6-Sigma processes. Products are fully characterized and qualified per appropriate JEDEC and AEG standards. To ensure highest quality, SiTime performs Lot Acceptance Testing (LAT) over the temperature range on a sample of parts from each production lot.

SiTime's extremely high quality has been proven out over shipment of 50 Million Units as of May 2011. Our actual field return rate is less than 1.2 DPPM, which is amongst the best in the semiconductor industry. As of May 2011, after four years of shipments, SiTime has had zero MEMS field failures.

SiTime operates using the fabless semiconductor model.  Hence, supplier management is a cornerstone of our QMS. We perform an initial assessment of our critical supply partners using stringent criteria, qualification and continuous monitoring. All of our supply partners are certified to ISO 9001, ISO 14001 and TS 16949 standards, and are Sony Green Partners.

SiTime provides the product and company collateral that our customers need to qualify SiTime's products, including but not limited to Reliability Reports, Confirmation of RoHS and Halogen Free Compliance.  Please log into your SiTime account to access this information real-time or contact your sales representative to have this information sent to you.

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Products Reliability Report Description
SiT8103 iconBasic CMOS and MEMS die reliability information applicable to all SiTime products
iconAdditional SiT8103 (a SiT8003 derivative) specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8102 iconBasic CMOS and MEMS die reliability information applicable to all SiTime products
iconAdditional SiT8102 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8004 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8004 (a SiT8003 derivative) specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8503 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8503 (a SiT8003 derivative) specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8002 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
SiT8003 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8003 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
icon UTAC 4-pin QFN package (without center pad) reliability information
SiT8033 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8033 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT3701 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
iconAdditional SiT8033 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8003XT icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8003XT specific CMOS die reliability information
icon UTAC 4-pin QFN package reliability information
SiT9001 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
iconAdditional SiT9001 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT9002 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9003 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT9003 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT9102 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9103 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9104 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9105 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information