SiTime, Silicon MEMS Oscillators and Clock Generators

Quality and Reliability

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iso-2013

ISO9001:2013 
Certificate of Registration

 

SiTime’s Quality Management System (QMS) is based on the ISO 9001:2008 quality system standard and SiTime has received ISO 9001:2008 certification. All SiTime products are designed and brought into production using our robust 6-Sigma processes. Products are fully characterized and qualified per appropriate JEDEC and AEC standards. To ensure the highest quality, SiTime performs Lot Acceptance Testing (LAT) over the temperature range on a sample of parts from each production lot.

SiTime's extremely high quality has been proven out over shipment of 200 million units as of January 2014. Our actual field return rate is less than 0.6 DPPM, which is amongst the best in the semiconductor industry. As of January 2014, after six years of shipments, SiTime has had zero MEMS field failures.

SiTime operates using the fabless semiconductor model.  Hence, supplier management is a cornerstone of our QMS. We perform an initial assessment of our critical supply partners using stringent criteria, qualification and continuous monitoring. All of our supply partners are certified to ISO 9001, ISO 14001 and TS 16949 standards, and are Sony Green Partners.

SiTime provides the product and company collateral that our customers need to qualify SiTime's products, including but not limited to Reliability Reports, Confirmation of RoHS and Halogen Free Compliance.  Please log into your SiTime account to access this information or contact your sales representative to have this information sent to you.

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Products Composition Report Description
SiT3701 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT1602 iconComposition declaration for 4QFN packages for SiT160X/8008/8009/1618/89XX
SiT1603
SiT1604
SiT8008
SiT8009
SiT1618
SiT8918
SiT8919
SiT8920
SiT8921
SiT8924
SiT8925
SiT3807 icon Composition Report for QFN Packages
SiT3808
SiT3809
SiT5000
SiT5001
SiT5002
SiT5003
SiT5004
SiT8208
SiT8209
SiT9121
SiT9122
SiT3821
SiT3822
SiT5021
SiT5022
SiT5023
SiT5024
SiT3921
SiT3922
SiT3621
SiT3622
SiT3651
SiT3652
SiT8002 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT8003 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT8003XT icon4-pin QFN package composition report
SiT8004 icon4-pin QFN package (without center pad) composition report
SiT8033 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT8103 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT8102 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT8208 icon Composition Report for QFN Packages
SiT8209
SiT8503 icon4-pin QFN package (without center pad) composition report
SiT9001 icon4-pin QFN package composition report
icon4-pin QFN package composition report
SiT9002 icon6-pin QFN package composition report
icon6-pin QFN package (without center pad) composition report
SiT9003 icon4-pin QFN package composition report
icon4-pin QFN package (without center pad) composition report
SiT9102 icon6-pin QFN package composition report
icon6-pin QFN package (without center pad) composition report
SiT9103 icon22-pin QFN package composition report
SiT9104 icon22-pin QFN package composition report
SiT9105 icon22-pin QFN package composition report

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Products Reliability Report Description

SiT1602

SiT1603

SiT1604

SiT8008

SiT8009

icon Product Reliability Report
SiT3701 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT3701 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information

iconUTAC 4-pin QFN package (without center pad) reliability information

SiT3807 iconAdditional SiT3807-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT3808 iconAdditional SiT3808-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT3809 iconAdditional SiT3809-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT5000 iconAdditional SiT5000-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT5001 iconAdditional SiT5001-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT5002 iconAdditional SiT5002-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT5003 iconAdditional SiT5003-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT5004 iconAdditional SiT5004-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8002 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
SiT8003 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8003 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
icon UTAC 4-pin QFN package (without center pad) reliability information
SiT8003XT icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8003XT specific CMOS die reliability information
icon UTAC 4-pin QFN package reliability information
SiT8004 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8004 (a SiT8003 derivative) specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8033 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8033 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8103 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8103 (a SiT8003 derivative) specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8102 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
iconAdditional SiT8102 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8208 iconAdditional SiT8208-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8209 iconAdditional SiT8209-specific CMOS die reliability information
iconCarsem 4-pin QFN package reliability information
iconUTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT8503 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT8503 (a SiT8003 derivative) specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT9001 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
iconAdditional SiT9001 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT9002 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
icon Product Reliability Summary - Stress Testing
SiT9003 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Additional SiT9003 specific CMOS die reliability information
icon Carsem 4-pin QFN package reliability information
icon UTAC 4-pin QFN package reliability information
iconUTAC 4-pin QFN package (without center pad) reliability information
SiT9102 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
icon Product Reliability Summary - Stress Testing
icon UTAC 4- & 6-pin QFN package (without center pad) reliability information
SiT9103 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9104 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9105 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
SiT9107 icon Basic CMOS and MEMS die reliability information applicable to all SiTime products
icon Carsem 6-pin QFN package reliability information
icon Product Reliability Summary - Stress Testing
icon UTAC 4- & 6-pin QFN package (without center pad) reliability information

SiT9120

SiT9121

SiT9122

SiT3821

SiT3822

icon Product Qualification Summary

icon Carsem 6-pin QFN package reliability information

icon Product Reliability Summary - Stress Testing