SiT1602 4MHz LVCMOS

Download the Frequency Test Report to get performance data for oscillators operating at specific frequencies.

These reports include measured data for devices with different supply voltages such as: frequency stability over temperature, random phase jitter, period Jitter, duty cycle, rise/fall time, amplitude, current consumption, and output waveforms.

Many SiTime oscillators can be programmed to a very wide range of specifications, including frequency and supply voltages. Because of the large potential combinations of parameters, SiTime provides frequency-specific test reports to supplement datasheet information, which include performance data typically measured at one sample frequency.

 

 
This document cannot be viewed on a mobile device or with increased screen zoom functions. Please download the document.