SiT9387AE-2B2-33N300.000000

Specs Value
Device Type Automotive & High Temp Oscillators
Frequency
300 MHz
Frequency Stability (ppm)
±25
Operating Temp. Range (°C)
-40 to 105
Output Type
LVDS
Supply Voltage (V)
3.3
Package Size (mm x mm)
3.2x2.5
Package Height (mm)
0.75
Feature Pin
No Connect
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
T = 3,000 ct
X = 1,500 ct
Y = 250 ct

High performance

  • 0.23 ps jitter (typ.)
  • ±25 ppm: Ensures best system performance in hostile environments

20x better vibration sensitivity

  • Minimizes packet loss in high-vibration environments

0.02 ps/mV power supply noise rejection (PSNR)

  • Simplify power supply design

3.2 x 2.5 mm package

  • Enables small form-factor system with stringent jitter requirement

Flexible programmable features

  • 220 to 725 MHz
  • 2.25 to 3.63 V
  • LVPECL, LVDS, HCSL: Customized oscillator specifications for optimal system performance;

Superior reliability

  • 1 billion hours MTBF
  • Lifetime warranty: Reduces field failures due to clock components and associated repair costs
  • ADAS computer
  • 10G to 100G Ethernet
  • Radar & LiDAR
  • Ethernet
  • Cameras
  • Automotive cameras

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Eval Boards (Contact SiTime) –  SiT6097 (3225) | SiT6085 (7050)

Reliability Calculator – Get FIT/MTBF data for various operating conditions

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

3225 6-Pins | 7050 6-Pins with CP – Preview packages with QFN 3D step models

Narrow By:

Resource Name Type
Increase automotive reliability and performance with ultra robust MEMS oscillators White Papers
AN10006 Best Design and Layout Practices Application Notes
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
SiT9387 Datasheet Datasheets
SiT9387 250MHz HCSL Freq. Test Reports
SiT9387 300MHz HCSL Freq. Test Reports
SiT9387 322.265625MHz HCSL Freq. Test Reports
SiT9387 325MHz HCSL Freq. Test Reports
SiT9387 250MHz LVDS Freq. Test Reports
SiT9387 300MHz LVDS Freq. Test Reports
SiT9387 322.265625MHz LVDS Freq. Test Reports
SiT9387 325MHz LVDS Freq. Test Reports
SiT9387 250MHz LVPECL Freq. Test Reports
SiT9387 300MHz LVPECL Freq. Test Reports
SiT9387 322.265625MHz LVPECL Freq. Test Reports
SiT9387 325MHz LVPECL Freq. Test Reports
AN10029 Output Terminations for Differential Oscillators Application Notes
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
SiT9387 (HCSL, 3.3 V) IBIS Models
SiT9387 (HCSL, 2.5 V) IBIS Models
SiT9387 (LVDS, 3.3 V) IBIS Models
SiT9387 (LVDS, 2.5 V) IBIS Models
SiT9387 (LVPECL, 3.3 V) IBIS Models
SiT9387 (LVPECL, 2.5 V) IBIS Models
AEC-Q100 Automotive Oscillators for ADAS, Camera Modules, and In-Vehicle Ethernet Product Briefs
Jitter Part 1: Principles and Practice with an Overview of Period Jitter Videos
Jitter Part 2: Phase Noise and Phase Jitter Videos
Jitter Part 3: C2C Jitter and Long Term Jitter Videos
QFN 3225 6-Pins 3D Step Models
QFN 7050 6-Pins with CP 3D Step Models
AN10066 LVDS Output with 600 mV to 1200 mV Swing Application Notes
AEC-Q100 Automotive Oscillators Product Briefs
Timing Solutions for Automotive Systems Brochures/Fliers
AN10067 Considerations for Measuring Phase Noise in Differential Oscillators Application Notes
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Misc. Resources
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
頑丈なMEMS発振器で自動車の信頼性と性能を高める White Papers
ADAS Computer Application Briefs
Automotive Cameras Application Briefs
Infotainment & Cluster Application Briefs
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