Silicon MEMS Reliability and Resilience |
Presentations |
Performance Comparison: Silicon MEMS Verses Quartz Oscillators |
Presentations |
How to Measure Clock Jitter in Precision Timing Applications |
Presentations |
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications |
Presentations |
Silicon MEMS vs Quartz Supply Chain |
Presentations |
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (S. Chinese) |
FAQs |
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (T. Chinese) |
FAQs |
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (Korean) |
FAQs |
Elite Platform MEMS Super-TCXOs and Oscillators FAQs |
FAQs |
Elite Platform - Transforming the Telecom and Networking Timing Market (Korean) |
Presentations |
Elite Platform - Transforming the Telecom and Networking Timing Market (S. Chinese) |
Presentations |
Elite Platform - Transforming the Telecom and Networking Timing Market (T. Chinese) |
Presentations |
Elite Platform - Transforming the Telecom and Networking Timing Market |
Presentations |
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) |
Product Briefs |
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Japanese) |
Product Briefs |
MEMS oscillators improve reliability and system performance in motor control applications |
White Papers |
MEMS-Based Resonators and Oscillators are Now Replacing Quartz |
Presentations |
Getting In Touch with MEMS: The Electromechanical Interface |
Presentations |
SiT9365 Datasheet |
Datasheets |
J-AN10006 発振器のPCBデザインのガイドライン |
Application Notes |
AN10006 Best Design and Layout Practices |
Application Notes |
J-AN10007 クロックジッタの定義と測定方法 |
Application Notes |
SiTime発振器の信頼性計算方法 |
Technology Papers |
AN10025 Reliability Calculations for SiTime Oscillators |
Application Notes |
J-AN10028 プローブを使用した発振器の出力波形計測方法 |
Application Notes |
MEMSおよび水晶ベース発振器の電磁場感受率の比較 |
Technology Papers |
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators |
Technology Papers |
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) |
Technology Papers |
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators |
Technology Papers |
J-AN10033 発振器の周波数測定ガイドライン |
Application Notes |
シリコンMEMS発振器の耐性および信頼性 |
Technology Papers |
Resilience and Reliability of Silicon MEMS Oscillators |
Technology Papers |
SiTimeの MEMS First™ プロセス技術 |
Technology Papers |
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 |
Presentations |
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications |
Presentations |
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques |
Presentations |
SiT9365 25MHz HCSL |
Freq. Test Reports |
SiT9365 30.72MHz HCSL |
Freq. Test Reports |
SiT9365 50MHz HCSL |
Freq. Test Reports |
SiT9365 53.125MHz HCSL |
Freq. Test Reports |
SiT9365 61.44MHz HCSL |
Freq. Test Reports |
SiT9365 98.304MHz HCSL |
Freq. Test Reports |
SiT9365 100MHz HCSL |
Freq. Test Reports |
SiT9365 106.25MHz HCSL |
Freq. Test Reports |
SiT9365 122.88MHz HCSL |
Freq. Test Reports |
SiT9365 125MHz HCSL |
Freq. Test Reports |
SiT9365 133.333333MHz HCSL |
Freq. Test Reports |
SiT9365 148.351648MHz HCSL |
Freq. Test Reports |
SiT9365 150MHz HCSL |
Freq. Test Reports |
SiT9365 153.6MHz HCSL |
Freq. Test Reports |
SiT9365 155.52MHz HCSL |
Freq. Test Reports |
SiT9365 156.25MHz HCSL |
Freq. Test Reports |
SiT9365 159.375MHz HCSL |
Freq. Test Reports |
SiT9365 160MHz HCSL |
Freq. Test Reports |
SiT9365 161.132813MHz HCSL |
Freq. Test Reports |
SiT9365 166.666666MHz HCSL |
Freq. Test Reports |
SiT9365 168.040678MHz HCSL |
Freq. Test Reports |
SiT9365 200MHz HCSL |
Freq. Test Reports |
SiT9365 212.5MHz HCSL |
Freq. Test Reports |
SiT9365 250MHz HCSL |
Freq. Test Reports |
SiT9365 300MHz HCSL |
Freq. Test Reports |
SiT9365 322.265625MHz HCSL |
Freq. Test Reports |
SiT9365 325MHz HCSL |
Freq. Test Reports |
SiT9365 30.72MHz LVDS |
Freq. Test Reports |
SiT9365 53.125MHz LVDS |
Freq. Test Reports |
SiT9365 61.44MHz LVDS |
Freq. Test Reports |
SiT9365 62.5MHz LVDS |
Freq. Test Reports |
SiT9365 74.25MHz LVDS |
Freq. Test Reports |
SiT9365 74.175824MHz LVDS |
Freq. Test Reports |
SiT9365 75MHz LVDS |
Freq. Test Reports |
SiT9365 77.76MHz LVDS |
Freq. Test Reports |
SiT9365 98.304MHz LVDS |
Freq. Test Reports |
SiT9365 100MHz LVDS |
Freq. Test Reports |
SiT9365 106.25MHz LVDS |
Freq. Test Reports |
SiT9365 122.88MHz LVDS |
Freq. Test Reports |
SiT9365 125MHz LVDS |
Freq. Test Reports |
SiT9365 133.333333MHz LVDS |
Freq. Test Reports |
SiT9365 148.351648MHz LVDS |
Freq. Test Reports |
SiT9365 150MHz LVDS |
Freq. Test Reports |
SiT9365 153.6MHz LVDS |
Freq. Test Reports |
SiT9365 155.52MHz LVDS |
Freq. Test Reports |
SiT9365 156.25MHz LVDS |
Freq. Test Reports |
SiT9365 159.375MHz LVDS |
Freq. Test Reports |
SiT9365 160MHz LVDS |
Freq. Test Reports |
SiT9365 161.132813MHz LVDS |
Freq. Test Reports |
SiT9365 166.666666MHz LVDS |
Freq. Test Reports |
SiT9365 168.040678MHz LVDS |
Freq. Test Reports |
SiT9365 200MHz LVDS |
Freq. Test Reports |
SiT9365 212.5MHz LVDS |
Freq. Test Reports |
SiT9365 250MHz LVDS |
Freq. Test Reports |
SiT9365 300MHz LVDS |
Freq. Test Reports |
SiT9365 322.265625MHz LVDS |
Freq. Test Reports |
SiT9365 325MHz LVDS |
Freq. Test Reports |
SiT9365 25MHz LVPECL |
Freq. Test Reports |
SiT9365 30.72MHz LVPECL |
Freq. Test Reports |
SiT9365 50MHz LVPECL |
Freq. Test Reports |
SiT9365 53.125MHz LVPECL |
Freq. Test Reports |
SiT9365 61.44MHz LVPECL |
Freq. Test Reports |
SiT9365 62.5MHz LVPECL |
Freq. Test Reports |
SiT9365 74.25MHz LVPECL |
Freq. Test Reports |
SiT9365 74.175824MHz LVPECL |
Freq. Test Reports |
SiT9365 75MHz LVPECL |
Freq. Test Reports |
SiT9365 77.76MHz LVPECL |
Freq. Test Reports |
SiT9365 98.304MHz LVPECL |
Freq. Test Reports |
SiT9365 100MHz LVPECL |
Freq. Test Reports |
SiT9365 106.25MHz LVPECL |
Freq. Test Reports |
SiT9365 122.88MHz LVPECL |
Freq. Test Reports |
SiT9365 125MHz LVPECL |
Freq. Test Reports |
SiT9365 133.333333MHz LVPECL |
Freq. Test Reports |
SiT9365 148.351648MHz LVPECL |
Freq. Test Reports |
SiT9365 150MHz LVPECL |
Freq. Test Reports |
SiT9365 153.6MHz LVPECL |
Freq. Test Reports |
SiT9365 155.52MHz LVPECL |
Freq. Test Reports |
SiT9365 156.25MHz LVPECL |
Freq. Test Reports |
SiT9365 159.375MHz LVPECL |
Freq. Test Reports |
SiT9365 160MHz LVPECL |
Freq. Test Reports |
SiT9365 161.132813MHz LVPECL |
Freq. Test Reports |
SiT9365 166.666666MHz LVPECL |
Freq. Test Reports |
SiT9365 168.040678MHz LVPECL |
Freq. Test Reports |
SiT9365 200MHz LVPECL |
Freq. Test Reports |
SiT9365 212.5MHz LVPECL |
Freq. Test Reports |
SiT9365 250MHz LVPECL |
Freq. Test Reports |
SiT9365 300MHz LVPECL |
Freq. Test Reports |
SiT9365 322.265625MHz LVPECL |
Freq. Test Reports |
SiT9365 325MHz LVPECL |
Freq. Test Reports |
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization |
Product Briefs |
DualMEMS and TurboCompensation Temperature Sensing Technology |
Technology Papers |
AN10061 Inphi PAM4 Performance when Driving Shared Reference Clocks |
Application Notes |
SC-AN10007 时钟抖动定义与测量方法 |
Application Notes |
Timing Solutions for Communications & Enterprise |
Brochures/Fliers |
Phase Noise Measurement Tutorial |
Videos |
SiT9365 (HCSL, 3.3 V) |
IBIS Models |
SiT9365 (HCSL, 2.5 V) |
IBIS Models |
SiT9365 (LVDS, 3.3 V) |
IBIS Models |
SiT9365 (LVDS, 2.5 V) |
IBIS Models |
SiT9365 (LVPECL, 3.3 V) |
IBIS Models |
SiT9365 (LVPECL, 2.5 V) |
IBIS Models |
Advantages of MEMS Timing - Parameters |
Videos |
SiTime MEMS Oscillators - Revolutionizing the Timing Market |
Videos |
Jitter Part 1: Principles and Practice with an Overview of Period Jitter |
Videos |
Jitter Part 2: Phase Noise and Phase Jitter |
Videos |
Jitter Part 3: C2C Jitter and Long Term Jitter |
Videos |
QFN 3225 6-Pins |
3D Step Models |
QFN 5032 6-Pins with CP |
3D Step Models |
QFN 7050 6-Pins with CP |
3D Step Models |
AN10066 LVDS Output with 600 mV to 1200 mV Swing |
Application Notes |
Timing Solutions for Industrial |
Brochures/Fliers |
Smart Network Interface Card (NIC) and IEEE1588 |
Application Briefs |
100G/200G/400G/800G Optical Modules |
Application Briefs |
SiTime MEMS Timing Solutions for Optical Module |
Videos |
Fronthaul Switches |
Application Briefs |
AN10067 Considerations for Measuring Phase Noise in Differential Oscillators |
Application Notes |
SiTime MEMS Timing Solutions for Servers |
Videos |
SiTime MEMS First 工艺 |
Technology Papers |
SiTime MEMS First 工艺 |
Application Notes |
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter |
Application Notes |
AN10071 Computing TIE Crest Factors for Telecom Applications |
Application Notes |
AN10070 Computing TIE Crest Factors for Non-telecom Applications |
Application Notes |
AN10072 Determine the Dominant Source of Phase Noise, by Inspection |
Application Notes |
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements |
Application Notes |
AN23033 Thermal Considerations for SiTime Products |
Application Notes |
Three advantages of MEMS timing technology in industrial automation applications |
White Papers |