SiT8924BA-13-33E-4.000000

Contact Sales
Datasheet
Five industry standard footprints as small as 2016 for all frequencies, voltages, and stabilities

SiT8924BA-13-33E-4.000000

Device Type Automotive & High Temp Oscillators
Frequency
4 MHz
Frequency Stability (ppm)
±50
Operating Temp. Range (°C)
-40 to 125
Supply Voltage (V)
3.3
Package Size (mm x mm)
2.5x2.0
Output Drive Strength*
Default
Feature Pin
OE

*See datasheet for details

Buy Now

Unit Pricing
Unit Count Unit Cost
1 - 99 $4.376
100 - 499 $3.501
500 - 999 $2.626
1,000 - 4,999 $1.75
>4,999 Contact Us
In Stock: 5000 pieces
Available for sale in cut tape packaging. Some orders with quantities less than 50 pieces may be shipped in ESD zip bags. To order quantities greater than 5,000, please contact SiTime Sales or use the Chat below.
Also purchase from
  • Image: SiT8924 4-pin package, top & bottom
    enlarge

    Image: SiT8924 4-pin package, top & bottom

  • SiT8924 pin assignments
    enlarge

    SiT8924 pin assignments

  • SiT8924 block diagram
    enlarge

    SiT8924 block diagram

Unique combination of

  • ±20 ppm frequency stability
  • over -55 to +125 °C automotive and military temp. ranges
  • in 2.0 x 1.6 mm package

0.1 ppb/g low g-sensitivity

  • Best robustness under high-vibration conditions

70 g vibration and 10,000 g shock

  • Best system reliability in harsh environments

Configurable drive strength and rise/fall time

  • Optimize EMI to reduce interference to other subsystems

5 industry-standard packages

  • 100% drop-in replacement of quartz XO

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • Mitigate shortage risks

 

  • Infotainment
  • ADAS computer
  • Cameras
  • LiDAR & Radar
  • Automotive Ethernet
  • Powertrain
  • Black boxes
  • Automotive XTAL replacement
  • Wireless charger

Narrow By:

Document Name Type
4L-QFN Package Composition Report (SiT14xx, SiT160x, SiT5008, SiT8008, SiT8009, SiT1618, SiT89xx) Composition Reports
Electronics Industry Citizen Coalition Template Other Quality Documents
Manufacturing Notes for SiTime Products Other Quality Documents
SiTime Conflict Minerals Policy Other Quality Documents
SiTime Environmental Policy Other Quality Documents
SiTime Warranty on Date Code Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
SiTime Oscillator Reliability Report (0.18 micron CMOS process products) Reliability Reports
4L-QFN Package Qualification Report - UTAC Reliability Reports
4L-QFN Package Qualification Report - ASE Reliability Reports
4L-QFN Package Qualification Report - Carsem Reliability Reports
SiT16XX, SiT89XX High Temp Product Qualification Report Reliability Reports
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
Tower Jazz Wafer SGS Report RoHS/Reach/Green Certificates
4L/6L-QFN Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
BOSCH Wafer SGS Report RoHS/Reach/Green Certificates
SiTime Environmental Compliance Declaration RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates

Eval Boards (Contact SiTime) – SiT6095 (2016) | SiT6081 (2520) | SiT6082 (3225) | SiT6083 (5032) | SiT6084 (7050)

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

Time Machine II Programmer – Program frequency, voltage, stability & more

Reliability Calculator – Get FIT/MTBF data for various operating conditions

2016 4-Pins | 2520 4-Pins | 3225 4-Pins | 5032 4-Pins| 7050 4-Pins – Preview packages with QFN 3D step models

Narrow By:

Resource Name Type
SiT8924 7.3728MHz LVCMOS Freq. Test Reports
SiT8924 8MHz LVCMOS Freq. Test Reports
SiT8924 9.8304MHz LVCMOS Freq. Test Reports
SiT8924 12.288MHz LVCMOS Freq. Test Reports
SiT8924 12MHz LVCMOS Freq. Test Reports
SiT8924 13.52127MHz LVCMOS Freq. Test Reports
SiT8924 13.225625MHz LVCMOS Freq. Test Reports
SiT8924 15MHz LVCMOS Freq. Test Reports
SiT8924 18.432MHz LVCMOS Freq. Test Reports
SiT8924 20MHz LVCMOS Freq. Test Reports
SiT8924 25MHz LVCMOS Freq. Test Reports
SiT8924 26MHz LVCMOS Freq. Test Reports
SiT8924 27MHz LVCMOS Freq. Test Reports
SiT8924 30MHz LVCMOS Freq. Test Reports
SiT8924 32MHz LVCMOS Freq. Test Reports
SiT8924 33MHz LVCMOS Freq. Test Reports
SiT8924 40MHz LVCMOS Freq. Test Reports
SiT8924 48MHz LVCMOS Freq. Test Reports
SiT8924 50MHz LVCMOS Freq. Test Reports
SiT8924 60MHz LVCMOS Freq. Test Reports
SiT8924 72MHz LVCMOS Freq. Test Reports
SiT8924 74.25MHz LVCMOS Freq. Test Reports
SiT8924 74.176MHz LVCMOS Freq. Test Reports
SiT8924 77.76MHz LVCMOS Freq. Test Reports
SiT8924 (LVCMOS, 2.5 V) IBIS Models
SiT8924 (LVCMOS, 2.8 V) IBIS Models
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
How to Get Instant Oscillators with SiTime's New Field Programmer Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Increase automotive reliability and performance with ultra robust MEMS oscillators White Papers
Field Programmable Timing Solutions for Medical Applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
SiT8924 Datasheet Datasheets
Time Machine II MEMS Oscillator Programmer Product Briefs
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較（耐衝撃と耐振動） Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
AEC-Q100 Automotive Oscillators for ADAS, Camera Modules, and In-Vehicle Ethernet Product Briefs
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
SiTime's Time Machine II - Part 1: How to Install Oscillator Programming Software Videos
SiTime's Time Machine II - Part 2: How to Program Field Programmable Oscillators Videos
QFN 2016 4-Pins 3D Step Models
QFN 2520 4-Pins 3D Step Models
QFN 3225 4-Pins 3D Step Models
QFN 5032 4-Pins 3D Step Models
QFN 7050 4-Pins 3D Step Models
Timing Solutions for Automotive Systems Brochures/Fliers
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Application Notes
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
頑丈なMEMS発振器で自動車の信頼性と性能を高める White Papers
Automotive LiDAR Application Briefs
Driver Monitoring System Application Briefs
Automotive ECU Application Briefs
Automotive Smart Mirrors Application Briefs
PCI Express in Automotive Application Briefs
PCI Express Timing Solutions in Automotive White Papers
Autonomous Ground Vehicles Application Briefs
NVIDIA DRIVE Orin Reference Design Application Briefs
AN23033 Thermal Considerations for SiTime Products Application Notes
  • SiT8924BA-13-33E-4.000000Y
  • SiT8924BA-13-33E-4.000000T
  • SiT8924BA-13-33E-4.000000D
  • SiT8924BA-13-33E-4.000000E
  • SiT8924BA-13-33E-4.000000X
  • SiT8924BA-13-33E-4.000000N
  • SiT8924BA-13-33E-4.000000F
  • SiT8924BA-13-33E-4.000000G
  • SiT8924BA-13-33E-4.000000S

Subscribe to SiTime news, training and offers

We process your personal information in accordance with our Privacy Policy. You can manage your communication preferences in the Preference Center.
gottseidank