SiT5022AI-1CE-33VM311.040000

SiT5022AI-1CE-33VM311.040000

Specs Value
Device Type TCXOs
Frequency
311.04 MHz
Frequency Stability (ppm)
±5.0
Operating Temp. Range (°C)
-40 to 85
Output Type
LVPECL
Supply Voltage (V)
3.3
Package Size (mm x mm)
5.0x3.2
Output Drive Strength*
Default
Feature Pin
VC
Pull Range (PPM PR)
±25

*See datasheet for details

Buy Now

Frequency stability ±5 ppm

  • Better timing margin that enhances system stability and robustness
  • Extensive programmability
  • Frequency from 220 to 625 MHz
  • LVPECL and LVDS output signaling types
  • Supply voltage of 2.5 V and 3.3 V:
  • Customized specifications for optimal system performance
  • Easy availability of any device specification within the operating range

Three industry-standard packages

  • 100% drop-in replacement for quartz, SAW and overtone oscillators without any design changes

4 to 6 weeks lead time

  • Reduce inventory overhead
  • Mitigate shortage risks

 

  • 10G Ethernet
  • PCIe
  • System clocking

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Document Name Type
4L/6L-QFN Package Composition Report (SiT820X, SiT912X, SiT50XX, SiT380X, SiT392X) Composition Reports
Electronics Industry Citizen Coalition Template Other Quality Documents
Manufacturing Notes for SiTime Products Other Quality Documents
SiTime Conflict Minerals Policy Other Quality Documents
SiTime Environmental Policy Other Quality Documents
SiTime Warranty on Date Code Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
SiTime Oscillator Reliability Report (0.18 micron CMOS process products) Reliability Reports
6L-QFN Package Qualification Report - Carsem Reliability Reports
SiT912X Product Qualification Report Reliability Reports
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
Tower Jazz Wafer SGS Report RoHS/Reach/Green Certificates
4L/6L-QFN Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
BOSCH Wafer SGS Report RoHS/Reach/Green Certificates
SiTime Environmental Compliance Declaration RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates

Evaluation Boards (Contact SiTime) – SiT6097 (3225) | SiT6086 (5032) | SiT6085 (7050)

Reliability Calculator – Get FIT/MTBF data for various operating conditions

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

QFN 3225 6-Pins | QFN 5032 6-Pins | QFN 7050 6-Pins – Preview packages with QFN 3D step models

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Resource Name Type
SiT5022 (LVDS High Frequency, 2.5 V) IBIS Models
SiT5022 (LVDS Low Frequency, 2.5 V) IBIS Models
SiT5022 (LVDS High Frequency, 3.3 V) IBIS Models
SiT5022 (LVDS Low Frequency, 3.3 V) IBIS Models
SiT5022 (LVPECL High Frequency, 2.5 V) IBIS Models
SiT5022 (LVPECL High Frequency, 3.3 V) IBIS Models
SiT5022 (LVPECL Low Frequency, 3.3 V) IBIS Models
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
MEMS oscillators improve reliability and system performance in motor control applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
SiT5022 Datasheet Datasheets
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
J-AN10039 TCXOの周波数安定性および周波数精度バジェット Application Notes
AN10039 TCXO Frequency Stability and Frequency Accuracy Budget Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
Phase Noise Measurement Tutorial Videos
Whack an Oscillator Demo Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
QFN 3225 6-Pins 3D Step Models
QFN 5032 6-Pins 3D Step Models
QFN 7050 6-Pins 3D Step Models
AN10066 LVDS Output with 600 mV to 1200 mV Swing Application Notes
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
AN10067 Considerations for Measuring Phase Noise in Differential Oscillators Application Notes
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Application Notes
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
AN23033 Thermal Considerations for SiTime Products Application Notes
  • SiT5022AI-1CE-33VM311.040000Y
  • SiT5022AI-1CE-33VM311.040000T
  • SiT5022AI-1CE-33VM311.040000D
  • SiT5022AI-1CE-33VM311.040000E
  • SiT5022AI-1CE-33VM311.040000X
  • SiT5022AI-1CE-33VM311.040000N
  • SiT5022AI-1CE-33VM311.040000F
  • SiT5022AI-1CE-33VM311.040000G
  • SiT5022AI-1CE-33VM311.040000S
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