SiT3373AI-1B9-25NC222.527472

SiT3373AI-1B9-25NC222.527472

Specs Value
Device Type Voltage-Controlled Oscillators
Frequency
222.527472 MHz
Frequency Stability (ppm)
±35
Operating Temp. Range (°C)
-40 to 85
Output Type
LVPECL
Supply Voltage (V)
2.5
Package Size (mm x mm)
3.2x2.5
Output Drive Strength*
Default
Feature Pin
No Connect
Pull Range (PPM PR)
±80

*See datasheet for details

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Unit Pricing
Unit Count Unit Cost
1 - 99 $15.812
100 - 499 $14.682
500 - 999 $13.27
1,000 - 4,999 $12.424
>4,999 Contact Us
In Stock: 2000 pieces
Available for sale in tape & reel packaging only. To order quantities greater than 5,000, please contact SiTime Sales or use the Chat below.
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Exceptional dynamic performance in real-life operating conditions

  • 0.23 ps jitter
  • ±15 ppm
  • 0.1% pull range linearity: Ensures best system performance in hostile environments

Same excellent phase noise under vibration

  • Minimizes link and data loss in high-vibration environments

0.05 ps/mV power supply noise rejection (PSNR)

  • Reduces BOM with simpler power supply design

3.0 x 2.5 mm package

  • Enables small form-factor system with stringent jitter requirement

Flexible programmable features

  • 220 to 725 MHz
  • 2.25 to 3.63 V
  • ±25 to ±3200 ppm pull range
  • LVPECL, LVDS, HCSL: Customize oscillator specifications for optimal system performance

Superior reliability

  • 1 billion hours MTBF
  • Lifetime warranty: Reduces field failures due to clock components and the repair costs

 

  • Cable model termination system (CMTS)
  • SONET
  • Telecom equipment
  • Wireless base stations
  • Networked video systems and digitizers
  • Jitter cleaner
  • Instrumentation
  • Networked audio systems
  • FPGA data recovery

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Evaluation Boards (Contact SiTime) – SiT6097 (3225) | SiT6085 (6085)

Frequency Slope (dF/dT) Calculator – Calculate frequency slope over temperature

Reliability Calculator – Get FIT/MTBF data for various operating conditions

Jitter Calculator and Plots – Convert phase noise to phase jitter, find phase noise plots

3225 6-Pins | 5032 6-Pins with CP | 7050 6-Pins with CP – Preview packages with QFN 3D step models

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Resource Name Type
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (S. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (T. Chinese) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs (Korean) FAQs
Elite Platform MEMS Super-TCXOs and Oscillators FAQs FAQs
Elite Platform - Transforming the Telecom and Networking Timing Market (Korean) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (S. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market (T. Chinese) Presentations
Elite Platform - Transforming the Telecom and Networking Timing Market Presentations
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) Product Briefs
Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Japanese) Product Briefs
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
SiT3373 Datasheet Datasheets
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
J-AN10020 VCXOの仕様定義 Application Notes
AN10020 Definitions of VCXO Specifications Application Notes
J-AN10021 PLL設計におけるVCXO性能のトレードオフ Application Notes
AN10021 VCXO Parameter Trade-offs for PLL Design Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
DualMEMS and TurboCompensation Temperature Sensing Technology Technology Papers
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
SiT3373 245.76MHZ HCSL Freq. Test Reports
SiT3373 320MHZ HCSL Freq. Test Reports
SiT3373 329.142857MHZ HCSL Freq. Test Reports
SiT3373 334.15MHZ HCSL Freq. Test Reports
SiT3373 491.52MHZ HCSL Freq. Test Reports
SiT3373 245.76MHZ LVDS Freq. Test Reports
SiT3373 320MHZ LVDS Freq. Test Reports
SiT3373 329.142857MHZ LVDS Freq. Test Reports
SiT3373 334.15MHZ LVDS Freq. Test Reports
SiT3373 491.52MHZ LVDS Freq. Test Reports
SiT3373 622.08MHZ LVDS Freq. Test Reports
SiT3373 625MHZ LVDS Freq. Test Reports
SiT3373 644.53125MHZ LVDS Freq. Test Reports
SiT3373 698.812335MHZ LVDS Freq. Test Reports
SiT3373 245.76MHZ LVPECL Freq. Test Reports
SiT3373 320MHZ LVPECL Freq. Test Reports
SiT3373 329.142857MHZ LVPECL Freq. Test Reports
SiT3373 334.15MHZ LVPECL Freq. Test Reports
SiT3373 491.52MHZ LVPECL Freq. Test Reports
SiT3373 622.08MHZ LVPECL Freq. Test Reports
SiT3373 625MHZ LVPECL Freq. Test Reports
SiT3373 644.53125MHZ LVPECL Freq. Test Reports
SiT3373 698.812335MHZ LVPECL Freq. Test Reports
Timing Solutions for Communications & Enterprise Brochures/Fliers
Phase Noise Measurement Tutorial Videos
SiT3373 (HCSL, 3.3 V) IBIS Models
SiT3373 (HCSL, 2.5 V) IBIS Models
SiT3373 (LVDS, 3.3 V) IBIS Models
SiT3373 (LVDS, 2.5 V) IBIS Models
SiT3373 (LVPECL, 3.3 V) IBIS Models
SiT3373 (LVPECL, 2.5 V) IBIS Models
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Jitter Part 1: Principles and Practice with an Overview of Period Jitter Videos
Jitter Part 2: Phase Noise and Phase Jitter Videos
Jitter Part 3: C2C Jitter and Long Term Jitter Videos
QFN 3225 6-Pins 3D Step Models
QFN 5032 6-Pins with CP 3D Step Models
QFN 7050 6-Pins with CP 3D Step Models
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
Timing Solutions for Industrial Brochures/Fliers
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
SiTime MEMS First 工艺 Technology Papers
SiTime MEMS First 工艺 Misc. Resources
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
  • SiT3373AI-1B9-25NC222.527472Y
  • SiT3373AI-1B9-25NC222.527472T
  • SiT3373AI-1B9-25NC222.527472D
  • SiT3373AI-1B9-25NC222.527472E
  • SiT3373AI-1B9-25NC222.527472X
  • SiT3373AI-1B9-25NC222.527472N
  • SiT3373AI-1B9-25NC222.527472F
  • SiT3373AI-1B9-25NC222.527472G
  • SiT3373AI-1B9-25NC222.527472S
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