Specs Value
Device Type 32 kHz TCXOs
32.768 kHz
Frequency Stability (ppm)
Operating Temp. Range (°C)
-40 to 85
Package Size (mm x mm)
Output Drive Strength*
DC-Coupled Output VOL or AC Swing
DC-Coupled Output VOH

*See datasheet for details

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This product ships directly from our factory, please allow 4-6 weeks for delivery.
Unit Pricing
Unit Count Unit Cost
1 - 99 $4.61
100 - 499 $4.19
500 - 999 $2.05
1,000 - 4,999 $1.24
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±10 ppm all-inclusive frequency stability

  • Improved local timekeeping and improved system power with less dependency on network timekeeping updates with mobile and wearable devices

Smallest footprint in chip-scale (CSP)

  • 1.5 x 0.8 mm: Saves board space

NanoPower: 990 nA (typ.)

  • Maximizes battery life

NanoDrive™ reduced swing oscillator output

  • Programmable output swing minimizes power

Internal VDD supply filtering

  • Eliminates external VDD bypass capacitor to maintain ultra-small footprint


  • Smart meters
  • Health and wellness monitors
  • Pulse-per-second (PPS) timekeeping
  • Medical electronics
  • Retail electronics
  • Long-range communications
  • Machine to machine (M2M)
  • Asset tracking
  • Smart farming
  • Smart city
  • Smartwatch
  • Fitness tracker
  • Home appliances

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SiT6098 (1508) Evaluation Board User Manual – Evaluate oscillator performance

Reliability Calculator Get FIT/MTBF data for various operating conditions

CSP 1508 4-Pins 3D Step Model – Preview oscillator packages in 3D

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Resource Name Type
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
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MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
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SiT1552 Datasheet Datasheets
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
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MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
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J-AN10033 発振器の周波数測定ガイドライン Application Notes
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AN10037 Optimized SiT15xx Drive Settings for 32 kHz Inputs of Low Power MCUs Application Notes
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AN10043 Measurement Guidelines for 32 kHz SiT15xx Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
J-AN10046 32 kHz Nano-Power MEMS 発振器による複数負荷駆動 Application Notes
AN10046 Driving Multiple Loads with 32 kHz Nano-Power MEMS Oscillators Application Notes
SiTimeの MEMS First™ プロセス技術 Technology Papers
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The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial Videos
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SiT1552 32 kHz TCXO Stability over Temperature Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Training Module: Replacing Crystals with Oscillators Videos
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CSP 1508 4-Pins 3D Step Models
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
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SiT6098EBB Evaluation Board User Manual User Manuals
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
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SiT1552 (LVCMOS, 1.5 V) IBIS Models
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SiTime MEMS First 工艺 Misc. Resources
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes
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ワイヤレス医療端末の電池寿命を延ばす White Papers
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