SiT9122


220 to 625 MHz, ±10 to ±50 ppm Differential XO

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The SiT9122 is a highly flexible, high-frequency, programmable differential oscillator that supports LVPECL and LVDS output signaling types. This differential oscillator covers any frequency between 220 to 625 MHz, with RMS phase jitter of 0.6 ps (typ.). Unlike quartz or SAW based traditional oscillators, the SiT9122 is available in any combination of voltage (2.5 V to 3.3 V), frequency stability (±10, ±20, ±25, and ±50 ppm) and package (3225, 5032, 7050) options.

Program oscillators to get instant samples, optimized performance, and fast prototyping | Learn More

Industry standard packages for drop-in replacement of quartz oscillators without any board changes
"Specs" "Value"
Oscillator Type XO-DE
Frequency 220 to 625 MHz
Frequency Stability (ppm) ±10, ±20, ±25, ±50
Phase Jitter (rms) 0.6 ps
Output Type LVPECL, LVDS
Operating Temperature Range (°C) -20 to +70, -40 to +85
Voltage Supply (V) 2.5, 3.3, 2.25 to 3.63
Package Type (mm²) 3.2x2.5, 5.0x3.2, 7.0x5.0
Features Field programmable
Availability Production

0.6 ps (typ.) integrated RMS phase jitter (12 kHz to 20 MHz)

  • Excellent jitter margin for the most stringent applications such as 1 to 10GbE

Excellent frequency stability, as low as ±10 ppm

  • Better timing margin that enhances system stability and robustness
  • Extensive programmability
  • Fixed frequency between 25 to 212.5 MHz
  • LVPECL and LVDS output signaling types
  • Supply voltage of 2.5 V and 3.3 V
  • Frequency stability from ±10 ppm and ±50 ppm
  • Customized specifications for optimal system performance
  • Cost-effective
  • Easy availability of any device specification within the operating range

Three industry-standard packages

  • 100% drop-in replacement for quartz, SAW and overtone oscillators without any design changes
  • 4 to 6 weeks lead time
  • Reduce inventory overhead
  • Mitigate shortage risks
  • 1Gb to 10Gb Ethernet
  • Optical modules
  • PCIe
  • FPGA
  • SATA/SAS
  • Fibre channel
  • System clocking
  • 测量与测试

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